Ceramic materials, devices, and methods for microwave applications

ABSTRACT

Ceramic materials, devices, and methods for microwave applications. In some embodiments, a composition can include a material with a formula Ba 4+x Sm (2/3)(14−x+0.5y) Ti 18−y Al y O 54 , with the quantity y being in a range 0&lt;y&lt;2, and the quantity x being in a range 0&lt;x&lt;2−y. Such a material can have a dielectric constant value greater than 60 and a Qf value greater than 10,000 at a frequency (f) at or less than 1 GHz. In some embodiments, a material having such properties can be implemented as a ceramic device and be utilized as a dielectric microwave resonator. Such a microwave resonator can be utilized as, for example, a narrowband radio-frequency (RF) filter.

CROSS-REFERENCE TO RELATED APPLICATION(S)

Any and all applications for which a foreign or domestic priority claim is identified in the Application Data Sheet as filed with the present application are hereby incorporated by reference under 37 CFR 1.57. This application is a continuation of U.S. application Ser. No. 14/561,182 filed Dec. 4, 2014, entitled ENHANCED Q HIGH DIELECTRIC CONSTANT MATERIAL FOR MICROWAVE APPLICATIONS, which claims priority to and the benefit of the filing date of U.S. Provisional Application No. 61/912,463 filed Dec. 5, 2013, entitled ENHANCED Q HIGH DIELECTRIC CONSTANT MATERIAL FOR MICROWAVE APPLICATIONS, the benefits of the filing dates of which are hereby claimed and the disclosures of which are hereby expressly incorporated by reference herein in their respective entirety.

BACKGROUND Field

The present disclosure generally relates to high dielectric constant materials for microwave applications.

Description of the Related Art

In some radio-frequency (RF) applications such as microwave applications, ceramic materials are often utilized as, for example, dielectric resonators. Such dielectric resonators can be implemented in devices such as narrowband filters.

SUMMARY

In some implementations, the present disclosure relates to a composition including a material with a formula Ba_(4+x)Sm_((2/3)(14−x+0.5y))Ti_(18−y)Al_(y)O₅₄, with the quantity y being in a range 0<y<2, and the quantity x being in a range 0<x<2−y.

In some embodiments, the quantity x can be in a range 0<x<1−0.5y corresponding to barium content being in a range of 0% to 50%. In some embodiments, the quantity y can be approximately 0.5 and the quantity x can be in a range from approximately 0.01 to approximately 1.0. In some embodiments, the quantity y can be approximately 1.0 and the quantity x can be in a range from approximately 0.01 to approximately 0.5. In some embodiments, the quantity y can be approximately 1.4 and the quantity x can be in a range from approximately 0.01 to approximately 0.3.

In some embodiments, at least some of Sm can be substituted by another lanthanide including La, Ce, Pr, Nd or Gd. In some embodiments, the other lanthanide such as La or Nd can substitute up to approximately 50 atomic percent of Sm.

In some embodiments, at least some of Ba can be substituted by Sr. Sr can substitute up to approximately 30 atomic percent of Ba.

In some embodiments, the composition can further include a minor additive including manganese oxide, manganese carbonate, cerium oxide, copper oxide, germanium oxide, silica or gallium oxide. The minor additive can constitute less than approximately 2 percent by weight. The minor additive can be cerium oxide or manganese oxide; and such a minor additive can constitutes less than 0.5 percent by weight.

In some embodiments, a composition having one or more of the foregoing features can further include a high Q second phase material. The high Q second phase material can include TiO₂, BaTi₄O₉ or Ba₂Ti₉O₂₀.

According to a number of implementations, the present disclosure relates to a dielectric resonator having a ceramic device configured as a microwave resonator. The ceramic device includes a material with a formula Ba_(4+x)Sm_((2/3)(14−x+0.5y))Ti_(18−y)Al_(y)O₅₄, with the quantity y being in a range 0<y<2, and the quantity x being in a range 0<x<2−y.

In some embodiments, the material can have a dielectric constant value that is greater than 60 for frequencies less than or equal to 1 GHz. Such a dielectric constant value can be in a frequency range that is greater than or equal to 700 MHz and less than or equal to 1 GHz. In some embodiments, the material can have a Qf value that is greater than 10,000, with the quantity Q being a quality factor, and the quantity f being a frequency expressed in GHz.

In accordance with some teachings, the present disclosure relates to a narrowband radio-frequency (RF) filter having an input port and an output port, and one or more dielectric resonators implemented between the input port and the output port. Each of the one or more dielectric resonators includes a ceramic device. The ceramic device includes a material with a formula Ba_(4+x)Sm_((2/3)(14−x+0.5y))Ti_(18−y)Al_(y)O₅₄, with the quantity y being in a range 0<y<2, and the quantity x being in a range 0<x<2−y.

In a number of implementations, the present disclosure relates to a method for fabricating a tungsten bronze material having titanium (Ti) in a plurality of octahedral sites. The method includes substituting aluminum (Al) for at least some of the titanium (Ti) in the octahedral sites to yield a dielectric constant value greater than 60 and a Qf value greater than 10,000 at a frequency (f) at or less than 1 GHz. The method further includes adjusting contents of A1 and A2 sites to compensate for charge imbalance resulting from the aluminum substitution of titanium.

In some embodiments, the tungsten bronze material can be represented by a formula [A2]₄[A1]₁₀Ti_(18−y)Al_(y)O₅₄. In some embodiments, substantially all of the A2 sites can be occupied by barium (Ba) and at least some of the A1 sites can be occupied by samarium (Sm), such that the adjusting includes adding x formula unit of Ba and (2/3)x formula unit of Sm to the A1 sites. In some embodiments, the method can further include substituting at least some of the samarium with another lanthanide (Ln) to yield a temperature coefficient of resonant frequency (τ_(f)) that is less negative.

For purposes of summarizing the disclosure, certain aspects, advantages and novel features of the inventions have been described herein. It is to be understood that not necessarily all such advantages may be achieved in accordance with any particular embodiment of the invention. Thus, the invention may be embodied or carried out in a manner that achieves or optimizes one advantage or group of advantages as taught herein without necessarily achieving other advantages as may be taught or suggested herein.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows that in some embodiments, a ceramic device such as a puck can include a material having one or more features as described herein.

FIG. 2 shows that in some embodiments, a ceramic puck having one or more features as described herein can include a center aperture dimensioned to allow, for example, tuning of the ceramic puck when utilized as a microwave resonator.

FIG. 3 shows an example of a tunable microwave resonator configuration.

FIG. 4 shows an example of a cavity filter having a plurality of cavities arranged between radio-frequency (RF) ports.

FIG. 5 shows an example of an RF system that can utilize one or more of the filter device of FIG. 4.

FIG. 6 shows a process that can be implemented to fabricate a ceramic material having one or more features as described herein.

FIG. 7 shows a process that can be implemented to press-form a shaped object from a powder material prepared as described herein.

FIG. 8 shows example stages associated with the process of FIG. 7.

FIG. 9 shows a process that can be implemented to sinter formed objects having one or more features as described herein.

FIG. 10 shows example stages associated with the process of FIG. 9.

DETAILED DESCRIPTION OF SOME EMBODIMENTS

The headings provided herein, if any, are for convenience only and do not necessarily affect the scope or meaning of the claimed invention.

Disclosed are compositions that can include materials having relatively high dielectric constant values and enhanced Q values. Examples of such materials are described herein in greater detail. Also described herein are examples of how such materials can be manufactured. Also described herein are examples of devices and applications in which such materials can be utilized.

In some radio-frequency (RF) applications such as microwave applications (e.g., low-frequency (700 MHz-1 GHz) applications), materials with a dielectric constant greater than 60 and having a desired or optimized quality factor Q can be desirable. For example, a Qf (product of Q and frequency f) value greater than 10,000 in the foregoing frequency range (700 MHz to 1 GHz range) can be desirable. Further, such a material preferably has a temperature coefficient of resonant frequency that is near zero. Conventional high-dielectric-constant materials typically do not have sufficient Q and/or require expensive raw materials such as Ga or Ge.

Disclosed are various examples of materials that can meet desired Q specifications or requirements without the expensive raw materials in their respective compositions. Also disclosed are examples of how such materials can be implemented in low-frequency microwave applications. Although described in such low-frequency context, it will be understood that one or more features of the present disclosure can also be implemented in other RF applications.

Various examples of dielectric materials and associated methods are described in U.S. Pat. No. 8,318,623 which is expressly incorporated by reference in its entirely and to be considered part of the specification of the present application.

Some compounds with an orthorhombic tungsten bronze structure can be represented by a general formula

Ba_(6−3x)Ln_(8+2x)Ti₁₈O₅₄,  (1)

where Ln can be a lanthanide such as lanthanum (La), cerium (Ce), praseodymium (Pr), neodymium (Nd), samarium (Sm) or gadolinium (Gd). Such a structure can be implemented for microwave dielectric applications due to their high dielectric constants (e.g., 60-100) and their ability to be tuned to a near zero temperature coefficient of resonant frequency.

In some applications, it is additionally desirable to minimize or reduce the dielectric loss tangent (tan δ) or to maximize or increase the quality factor Q (an inverse of dielectric loss tangent, 1/tan δ) of a dielectric material used for microwave applications, since such a property typically yields sharper resonances and sharper transitions for filter applications.

From a crystallographic perspective, the foregoing materials can be represented as

[A2]₄[A1]₁₀Ti₁₈O₅₄.  (2)

Typically, the 10 available A1 sites are rhombic while the 4 available A2 sites are pentagonal. The Ti atoms typically occupy octahedral sites. The A1 sites may be occupied by Ba atoms, Ln atoms, or may be vacant. The A2 sites may be occupied by Ba or Ln atoms. Although described in the context of rhombic sites, it will be understood that one or more features of the present disclosure can also be implemented in other types of sites.

For the orthorhombic tungsten bronze structure represented by Formula 1, it is generally understood that the value of Q can be optimal when the quantity x has a value of 2/3 (0.667), where substantially all of the Ba atoms reside in the pentagonal A2 sites and substantially all of the lanthanide (Ln) atoms reside in the rhombic A1 sites. A number of studies have shown that the value of Q is typically maximum when the lanthanide (Ln) chosen is Sm, and decreases with increasing lanthanide size in the order of, for example, Nd, Pr, Ce and La. The Gd material shows a very limited solid solution range and typically yields a relatively low Q as well.

Among the foregoing lanthanide examples, Sm and Gd are lanthanides that yield negative temperature coefficient of resonant frequency (τ_(f)) values. The other lanthanides Nd, Pr, Ce and La series all yield positive τ_(f) values. In the context of dielectric resonators, temperature coefficient of resonant frequency (τ_(f)) is typically a combination of temperature coefficient of dielectric constant of a resonator, temperature coefficient of the resonator cavity, and the coefficient of thermal expansion of the resonator.

Based on the foregoing properties of the example lanthanides, a typical design strategy can involve blends of two lanthanides such as Sm and Nd or Sm and La to achieve temperature compensated ceramic bodies. Aside from such design considerations based on physical properties, availability and/or cost of raw materials can also impact designs of ceramic devices. For example, there is a demand for ceramic solutions for microwave materials that do not contain scarce and/or costly elements such as neodymium (Nd), gallium (Ga) or germanium (Ge). Samarium (Sm) and lanthanum (La) are significantly less scarce for rare earth elements.

As described in U.S. Pat. No. 8,318,623, as well as in, for example, U.S. Pat. Nos. 5,182,240, 5,185,304 and 5,310,710, at least some of the titanium in tungsten bronze material can be substituted by, for example, aluminum. The resulting charge imbalance can be compensated by adding Ln material (e.g., Nd, a mixture of Nd and Sm, a mixture of Nd and Y, or a mixture of Sm and non-lanthanide Bi) into the vacant A1 lattice site(s) (e.g., in Formula 2). It is also noted that in the tungsten bronze material of Formula 1 (Ba_(6−3x)Ln_(8+2x)Ti₁₈O₅₄), for x values less than or equal to 2/3 where Ln=Nd (in the BaO—Nd₂O₃—TiO₂ ternary system), the resulting phase is chemically compatible with the high Q rutile form of TiO₂ (with τ_(f) being greater than approximately 500 ppm/° C.).

In some embodiments, aluminum (Al) can be substituted for titanium (Ti) in the octahedral site to yield, contrary to published findings, highest or enhanced Q material at approximately 1 GHz for x values less than or equal to 2/3. In the context of Formula 2, the foregoing substitution of Ti by Al can be represented as

[A2]₄[A1]₁₀Ti_(18−y)Al_(y)O₅₄,  (3)

where y unit of Ti is substituted by y unit of Al.

As described herein, charge imbalance resulting from substitution of Ti⁺⁴ with Al⁺³ can be compensated by appropriate occupations of the A1 and/or A2 sites by, for example, Ln⁺³ and/or Ba⁺², respectively. In the context of such Ln and Ba, Formula 3 can be expressed as a modified form of Formula 1, as one of the following example formulas

Ba_(6−3x)Ln_(8+2x+(y/3))Ti_(18−y)Al_(y)O₅₄,  (4A)

Ba_(6−3x+(y/2))Ln_(8+2x)Ti_(18−y)Al_(y)O₅₄, and  (4B)

Ba_(6−3x−y)Ln_(8+2x+y)Ti_(18−y)Al_(y)O₅₄,  (4C)

where the charge imbalance of y (+4 of Ti to +3 of Al) can be compensated by adding an appropriate amount of Ba (+2), Ln (+3), or a mixture of the two. For example, in Formula 4A, charge balancing can be achieved by adding Ln³⁺, with the formula unit of y/3 to account for the +3 charge. In Formula 4B, charge balancing can be achieved by adding Ba²⁺, with the formula unit of y/2 to account for the +2 charge. In Formula 4C, charge balancing can be achieved by subtracting y formula unit of Ba (+2) and adding y formula unit of Ln (+3). It is noted that Formulas 4A and 4B are extreme cases involving only one type of addition (of Ln or Ba), and that the charge imbalance may also be compensated with a mixture of Ln³⁺ and Ba²⁺ (such as the example of Formula 4C). Previous studies have taught that the Q is optimal only if all of the barium remains on the A2 site and the lanthanide remains on the A1 site. However, the present disclosure shows that such is not necessarily true.

It is noted that in Formula 4, there are 10 available rhombic A1 sites. Accordingly, and in the context of the example of Formula 4A, a limit can be imposed, where formula unit of 8+2x+(y/3) has a maximum value of 10. In such a configuration, the maximum value for y is 2 when x=2/3. In terms of Al substitution of Ti, the maximum amount of aluminum which may be substituted for titanium is 2 formula units (y=2).

Based on the foregoing limit of 2 formula units of aluminum substitution of titanium, aluminum content can be expressed as

aluminum percent=100(y/2),  (5)

where y represents the formula units of aluminum in the composition of Formula 4A. For example, when y=2 in which Formula 4A becomes Ba₄Ln₁₀Ti₁₆Al₂O₅₄ (with x=2/3), aluminum percent is 100%. In another example, when y=1 and x has a value of 2/3 based on the formula units for barium (6−3x) being equal to 4, Formula 4A becomes Ba₄Ln_(9.667)Ti₁₇AlO₅₄, with aluminum percent being 50%. Note that in both cases (of aluminum percent of 100% and 50%), all of the charge compensation for the aluminum substitution comes from adding additional Ln³⁺ to the A1 site.

In some embodiments, where the compensation of the aluminum substitution at least partially occurs by adding Ba²⁺ to the A1 site, the maximum amount of barium which can fit into the A1 site can depend on the foregoing aluminum percent, due to charge balance considerations. The maximum amount of barium which can be placed in the A1 site (Ba_(max)) is equal to 2−(aluminum percent)/50. The barium percent (in the A1 site) can then be expressed as (N_(Ba)−4)/Ba_(max), where N_(Ba) is the total number of formula units of Ba. Equivalently, barium percent can be expressed as

barium percent=(N_(Ba)−4)/(2−(aluminum percent)/50),  (6)

where N_(Ba) is the number of barium atoms in the formula (e.g., 6−3x−y in Formula 4). For example, in the case of aluminum percent being 100 (yielding a zero denominator), barium percent is zero, with no barium in the A1 sites and all of the Ba atoms occupying the A2 sites. In another example, the 50%-aluminum configuration that yields the example formula Ba₄Ln_(9.667)Ti₁₇AlO₅₄ also results in barium percent of zero, since all of the available aluminum is compensated by additional Ln³⁺ in the A1 site. Examples of non-zero barium percent configurations are described herein in greater detail.

As described herein in reference to the example of Formula 4C, an aluminum substitution of titanium by an amount of y formula units can be charge-compensated by an addition of lanthanide (by y formula units) and a subtraction of barium (by y formula units). In the context of zero barium percent configurations, a 100%-aluminum configuration can yield Ba₄Ln₁₀Ti₁₆Al₂O₅₄, and a 50%-aluminum configuration can yield Ba₄Ln_(9.667)Ti₁₇AlO₅₄. In the context of non-zero barium percent configurations, at least some of the barium can occupy the A1 sites.

In configurations where more than four formula units of barium are present, Formula 4C can be expressed as

Ba_(4+x′)Ln_(8+2x+y−(2/3)x′)Ti_(18−y)Al_(y)O₅₄,  (7)

where x′ represents the additional formula units of barium. Equivalently, x′ can be expressed as x′=N_(Ba)−4. Such an increase in Ba (+2) can be charge balanced by a decrease of (2/3)x′ formula units of Ln(+3). In Formula 7, the aluminum substitution formula unit quantity y can be greater than zero and less than or equal to 2 as described herein, such that 0<y≤2. The extra-barium formula unit x′ can be greater than or equal to zero, and less than or equal to a maximum value of 2−y, such that 0≤x′≤2−y. Such a maximum value of 2−y can be calculated by, for example, assuming that the Ln formula unit of 8+2x+y−(2/3)x′ (of Formula 7) and the additional Ba formula unit of x′ sum to the maximum A1 occupation number of 10 (e.g., 8+2x+y−(2/3)x′+x′=10). The quantity x′ can be solved to yield x′=2−y.

In some embodiments, all four A2 sites can be occupied by barium and the additional x′ formula units of barium can occupy A1 sites. In such embodiments, since all four of the A2 sites are occupied by 6−3x−y formula units (barium number in Formula 4C), 6−3x−y can be set to equal 4, which yields an expression x=(2/3)−(1/3)y. Substituting such an expression of x into the subscript of Ln in Formula 7, the subscript becomes 8+2[(2/3)−(1/3)y]+y−(2/3)x′, which in turn can be expressed as (2/3)[14+(1/2)y−x′]. Accordingly, Formula 7 can be expressed as

Ba_(4+x′)Ln_((2/3)[14+0.5y−x])Ti_(18−y)Al_(y)O₅₄,  (8)

where the aluminum substitution formula unit quantity y can be greater than zero and less than or equal to 2, such that 0<y≤2. The extra-barium formula unit x′ can be greater than or equal to zero, and less than or equal to a maximum value of 1−0.5x, such that 0≤x′≤1−0.5y. Such a maximum value of 1−0.5y can be calculated by, for example, assuming that the Ln formula unit of (2/3)[14+0.5y−x′] (of Formula 8) and the additional Ba formula unit of x′ sum to the maximum A1 occupation number of 10 (e.g., (2/3)[14+0.5y−x′]+x′=10). The quantity x′ can be solved to yield x′=1−0.5y. It is noted that in Formula 8, the four formula units of Ba occupy all of the four A2 sites; and such occupation is reflected in the Ln formula unit of (2/3)[14+0.5y−x′].

In embodiments where lanthanide is samarium (Ln=Sm), Formula 8 can be expressed as

Ba_(4+x′)Sm_((2/3)[14+0.5y−x′])Ti_(18−y)Al_(y)O₅₄.  (9)

In such a system, the substitution of aluminum (Al) for titanium (Ti) as described herein can yield high Q rutile form of TiO₂ being chemically compatible with Formula 1 (Ba_(6-3x)Ln_(8+3x)Ti₁₈O₅₄) when the value of x is less than or equal to 2/3, similar to the foregoing neodymium (Nd) system (Ln=Nd). In some embodiments of the Sm system, one or more lanthanides having positive τ_(f) values can be introduced to compensate for the negative τ_(f) value associated with Sm. For example, some of Sm can be substituted by another lanthanide such as La, Ce, Pr, Nd or Gd. In some embodiments, the other lanthanide can be La or Nd, and such lanthanide can substitute up to approximately 50 percent (e.g., mole %) of Sm.

Although various examples are described in the context of barium, it will be understood that one or more of other alkaline earth metals can replace at least some of the barium content. For example, strontium (Sr) can be included, and its content percent can be calculated in the same manner as the barium percent described herein in reference to Equation 6.

In some embodiments having x values <0.667 in, for example Formula 4, there may be conditions where rutile TiO₂ can be added as a second crystallographic phase. Examples of such additions are described herein in greater detail. Further, some embodiments can include small amounts of acceptor dopants such as MnO₂ or CeO₂ added to the composition to, for example, prevent or reduce thermal reduction of the titanium from Ti⁴⁺ to Ti³⁺.

Table 1 lists various samples having various combinations of aluminum percent (Al %, as described in Equation 5), barium percent (Ba %, as described in Equation 6), strontium percent (Sr %, similar to the barium percent), lanthanum percent (La %, mole percent), cerium oxide weight percent (CeO₂ w %), and titanium oxide or rutile weight percent (TiO₂ w %). Table 1 also lists density values of selected ones of the samples. Empty cells, if any, correspond to values that are either not applicable or not available. It will be understood that each of the samples listed in Table 1 is based on Formula 9 (Ba_(4+x′)Sm_((2/3)[14+0.5y−x′])Ti_(18−y)Al_(y)O₅₄), with the various percent values corresponding to substitutions of Ba or Sm, or introduction of second phase materials (e.g., TiO₂).

Table 2 lists Q values for the same samples of Table 1, at or near f=1 GHz. Corresponding Qf values are also listed. Table 2 also lists dielectric constant values (∈′) corresponding to the listed approximately 1 GHz frequency values for selected ones of the samples. Table 2 also lists values of temperature coefficient of resonant frequency (τ_(f)) for selected ones of the samples. Empty cells, if any, correspond to values that are either not applicable or not available.

Table 3 lists Q values for some of the samples of Table 1, at or near f=3 GHz. Corresponding Qf values are also listed. Table 3 also lists dielectric constant values (∈′) corresponding to the listed approximately 3 GHz frequency values. Empty cells, if any, correspond to values that are either not applicable or not available.

TABLE 1 Den- Sam- sity ple Al Ba Sr La CeO₂ TiO₂ (g/ No. % % % % w % w % cm³) 1 100 0 0 2.75 0 0 2 100 0 0 2.75 0 0 3 100 0 0 2.75 0 0 4 100 0 0 2.75 0 0 5 100 0 0 2.75 0 0 6 100 0 0 2.75 0 0 7 100 0 0 2.75 0 0 8 75 0 0 0 0 0 9 75.1 24.8 0 0 0 0 10 50 0 0 0 0 0 11 50 25 0 0 0 0 12 25 0 0 0 0 0 13 24.9 24.9 0 0 0 0 14 0 0 0 0 0 25 15 0 25.1 0 0 0 25 16 75 25 0 0 0 25 17 50 0 0 0 0 25 18 50 25 0 0 0 25 19 25 0 0 0 0 25 20 25 25 0 0 0 25 21 25 0 0 0 0 12.5 22 25 25 0 0 0 12.5 23 75.1 24.8 0 0 0.25 0 5.453 24 50 25 0 0 0.5 0 25 24.9 24.9 0 0 0.75 0 26 0 25.1 0 0 0.75 25 27 0 25.1 0 0 0.875 12.5 28 24.9 24.9 0 0 0.558 25 29 24.9 24.9 0 0 0.658 12.5 30 74.2 48.06 0 2.8 0.25 0 5.896 31 49.85 25.09 0 5.78 0.5 0 32 24.98 24.91 0 8.89 0.75 0 33 0 24.92 0 12.14 0.875 0 34 24.98 24.91 0 8.89 0.75 25 35 24.98 24.91 0 8.89 0.75 12.5 36 74.75 25.34 0 2.84 0 0 5.916 37 49.68 24.91 0 5.82 0 0 38 24.67 24.8 0 8.92 0 0 39 0 24.92 0 12.14 0 25 40 0 24.92 0 12.14 0 12.5 41 24.67 24.8 0 8.92 0 25 42 24.67 24.8 0 8.92 0 12.5 43 9.93 24.9 0 5 0 0 44 9.93 25.1 0 10 0 0 45 31.28 24.88 0 5 0 0 46 31.28 24.88 0 10 0 0 47 50.02 24.84 0 5 0 0 48 50.02 24.84 0 10 0 0 49 70.07 25 0 5 0 0 5.74  50 70.07 25 0 10 0 0 51 89.95 25.87 0 5 0 0 52 89.95 25.87 0 10 0 0 53 9.93 24.9 0 2.5 0 0 54 31.28 24.88 0 2.5 0 0 55 50.02 24.84 0 2.5 0 0 5.76  56 70.07 25 0 2.5 0 0 5.74  57 89.95 25.87 0 2.5 0 0 58 10 31.99 0 5 0 0 59 10 31.99 0 10 0 0 60 29.8 33.8 0 5 0 0 61 29.8 33.8 0 10 0 0 62 49.6 37.06 0 5 0 0 63 49.6 37.06 0 10 0 0 64 69.4 45.02 0 5 0 0 5.7  65 69.4 45.02 0 10 0 0 5.7  66 89.23 82.2 0 5 0 0 5.64  67 89.23 82.2 0 10 0 0 5.66  68 10 31.99 0 2.5 0 0 69 29.8 33.8 0 2.5 0 0 70 49.6 37.06 0 2.5 0 0 71 69.4 45.02 0 2.5 0 0 5.75  72 89.23 82.2 0 2.5 0 0 5.67  73 74.2 48 0 10 0 0 5.77  74 74.2 48 0 10 0 10 75 74.2 0 48 10 0 0 5.81  76 74.2 48 0 20 0 0 5.78  77 74.2 48 0 30 0 0 5.77  78 74.2 48 0 40 0 0 5.67  79 74.75 25.35 0 10 0 0 5.8  80 74.75 25.35 0 10 0 10 81 74.75 0 25.35 10 0 0 5.8  82 74.75 25.35 0 20 0 0 5.79  83 74.75 25.35 0 30 0 0 5.77  84 74.75 25.35 0 40 0 0 5.71  85 70.06 25 0 10 0 0 5.76  86 70.06 25 0 10 0 10 87 70.06 0 25 10 0 0 5.82  88 70.06 25 0 20 0 0 5.66  89 70.06 25 0 30 0 0 5.73  90 70.06 25 0 40 0 0 5.73  91 89.25 82.3 0 10 0 0 92 89.25 82.3 0 10 0 10 93 89.25 0 82.3 10 0 0 94 89.25 82.3 0 20 0 0 95 89.25 82.3 0 30 0 0 96 89.25 82.3 0 40 0 0 97 69.35 45 0 10 0 0 5.76  98 69.35 45 0 10 0 10 99 69.35 0 45 10 0 0 5.79  100 69.35 45 0 20 0 0 5.73  101 69.35 45 0 30 0 0 5.76  102 69.35 45 0 40 0 0 5.64  103 50 0 0 5 0 0 104 50 0 0 5 0 10 105 50 12.5 0 5 0 0 106 50 12.5 0 5 0 10 107 50 25 0 5 0 0 108 50 25 0 5 0 10 109 50 37.5 0 5 0 0 110 50 37.5 0 5 0 10 111 50 50 0 5 0 0 112 50 50 0 5 0 10 113 50 75 0 5 0 0 114 50 75 0 5 0 10 115 50 100 0 5 0 0 116 50 100 0 5 0 10 117 66.67 0 0 5 0 0 118 66.67 0 0 5 0 10 119 66.67 25 0 5 0 0 120 66.67 25 0 5 0 10 121 66.67 50 0 5 0 0 122 66.67 50 0 5 0 10 123 66.67 75 0 5 0 0 124 66.67 75 0 5 0 10 125 66.67 100 0 5 0 0 126 66.67 100 0 5 0 10 127 83.33 50 0 5 0 10 128 83.33 100 0 5 0 0 129 83.33 100 0 5 0 10 130 70.06 25 0 40 0 0 131 70.06 25 0 40 0.067 0 132 70.06 25 0 40 0.033 0 133 70.06 25 0 40 0.067 0 134 70.06 25 0 40 0 0 135 70.06 25 0 40 0.133 0 136 50 20 0 0 0 8.333 137 50 20 0 0 0.067 8.333 138 50 20 0 0 0.067 8.333 139 25 25 0 0 0 8.333 140 25 25 0 0 0.067 8.333 5.61  141 25 25 0 0 0.033 8.333 5.61  142 25 25 0 0 0.067 8.333 143 25 25 0 10 0 8.333 144 25 25 0 10 0.067 8.333 145 25 25 0 10 0.033 8.333 146 25 25 0 10 0.067 8.333 147 50 27 0 0 0.067 10 148 50 29 0 0 0.067 10 149 50 31 0 0 0.067 10 150 50 33 0 0 0.067 10 151 50 35 0 0 0.067 10 152 50 37 0 0 0.067 10 153 50 39 0 0 0.067 10 154 50 41 0 0 0.067 10 155 50 43 0 0 0.067 10 156 50 45 0 0 0.067 10 157 70.06 25 .3GeO2 0 .067MnO2 0 158 70.06 25 .3GeO2 0 0.067 0 159 70.06 25 .3GeO2 40 .067MnO2 0 160 70.06 25 .3GeO2 40 0.067 0 161 70.06 25 0 50Nd2O3 0.067 0 162 70.06 25 0 50Nd2O3 .067MnO2 0 163 70.06 25 .3GeO2 50Nd2O3 0.067 0 164 70.06 25 .3GeO2 50Nd2O3 .067MnO2 0 165 25 25 .3GeO2 0 0.067 10 166 25 25 .3GeO2 10 0.067 10 167 25 25 0 10Nd2O3 0.067 0 168 25 25 .3GeO2 10Nd2O3 0.067 0 169 25 25 0 50Nd2O3 0.067 0 170 25 25 .3GeO2 50Nd2O3 0.067 0

TABLE 2 Sample No. Q (1 GHz) f Qf (1 GHz) ε′ (1 GHz) τ_(F) 1 2170 1.156 2508.52 2 3170 1.172 3715.24 3 3420 1.111 3799.62 4 6580 1.089 7165.62 5 4770 1.045 4984.65 6 7300 1.013 7394.9 7 7830 0.949 7430.67 8 2620 1.092 2861.04 9 9510 1.104 10499.04 10 3600 1.054 3794.4 11 6720 1.052 7069.44 12 4410 1.016 4480.56 13 3600 1.0528 3790.08 81.8 14 15 16 1000 0.98 980 82 17 1500 0.9543 1431.45 81.9 18 4780 0.974 4655.72 19 1400 0.9484 1327.76 84.2 20 1500 0.9805 1470.75 79.7 21 1000 0.9929 992.9 78.4 22 1400 1.026 1436.4 73.8 23 9700 1.1895 11538.15 −41.61 24 8000 1.0859 8687.2 68.3 25 2500 1.0306 2576.5 76.6 26 3900 1.0723 4181.97 76.7 27 28 1000 0.9966 996.6 77.1 29 30 12000 1.0818 12981.6 63.1 −62.53 31 9400 1.0363 9741.22 32 9900 1.0109 10007.91 33 5200 1.0903 5669.56 34 5000 1.2524 6262 35 3800 1.3473 5119.74 36 11000 1.0839 11922.9 66 −61.19 37 9600 1.0446 10028.16 38 8000 0.9915 7932 39 6000 1.0312 6187.2 40 6300 1.0055 6334.65 41 8000 1.1036 8828.8 42 8000 1.0685 8548 43 7680 0.9718 7463.424 44 7668 0.9669 7414.1892 45 8742 1.0128 8853.8976 46 8734 1.0081 8804.7454 47 9910 1.0601 10505.591 48 9696 1.0502 10182.739 49 10923 1.0876 11879.855 −55.32 50 10580 1.0904 11536.432 −48.21 51 4352 1.1621 5057.4592 52 7031 1.2009 8443.5279 53 7079 1.0114 7159.7006 54 7885 1.1273 8888.7605 55 10224 1.0482 10716.797 −46.15 56 10780 1.1261 12139.358 −57.93 57 3674 1.1532 4236.8568 58 3556 0.9687 3444.6972 59 4647 0.9609 4465.3023 60 7770 1.0052 7810.404 61 7948 1.0043 7982.1764 62 9417 1.0411 9804.0387 63 9302 1.0517 9782.9134 64 10341 1.0823 11192.064 −54.1 65 10018 1.0909 10928.636 −46.83 66 10860 1.1288 12258.768 −62.16 67 10445 1.1151 11647.22 −55.87 68 2653 0.9673 2566.2469 69 6935 1.0049 6968.9815 70 9223 1.0384 9577.1632 71 10003 1.1293 11296.388 −58.02 72 11197 1.1336 12692.919 −65.23 73 9700 1.0987 10657.39 65.5 −50.34 74 4500 1.1571 5206.95 69.8 75 9300 1.0991 10221.63 66.3 −51.46 76 9400 1.1015 10354.1 67.8 −32.96 77 8200 1.0835 8884.7 69.5 −12.82 78 6600 1.1135 7349.1 70.5 15.09 79 10600 1.1003 11663.18 66 −52.13 80 3600 1.0643 3831.48 67.1 81 8800 1.1149 9811.12 65.8 −53.34 82 9800 1.09 10682 67.5 −36.93 83 8800 1.0905 9596.4 68.8 −16.24 84 7400 1.0616 7855.84 69.9 7.33 85 10300 1.1232 11568.96 65.8 −48.71 86 4300 1.0486 4508.98 69.3 87 8700 1.1725 10200.75 67 −51.36 88 10400 1.0536 10957.44 65.5 −32.12 89 9000 1.045 9405 68.9 −14.01 90 7600 1.0537 8008.12 71.9 9.81 91 9200 1.2902 11869.84 61.2 92 2600 1.088 2828.8 64.1 93 8000 1.1366 9092.8 61.5 94 9200 1.1044 10160.48 61.9 95 7500 1.1018 8263.5 62.8 96 6000 1.1165 6699 62.8 97 10000 1.0912 10912 66.9 −47.17 98 4800 1.0472 5026.56 71.9 99 9400 1.0952 10294.88 67.8 −49.31 100 9500 1.0742 10204.9 68.1 −29.03 101 8400 1.0607 8909.88 70.9 −8.75 102 6800 1.0476 7123.68 71.2 20.57 103 4300 1.0483 4507.69 70.8 104 2500 1.0174 2543.5 73.9 105 10300 1.0656 10975.68 68.7 106 2700 1.0132 2735.64 75.6 107 9850 1.0651 10491.235 69.2 108 7000 1.0099 7069.3 75.7 109 9000 1.0788 9709.2 70.1 110 6800 1.0302 7005.36 73.6 111 2000 1.0491 2098.2 71.9 112 4800 1.1632 5583.36 55 113 114 5700 1.0687 6091.59 66 115 116 117 4200 1.0897 4576.74 67.4 118 5600 1.0445 5849.2 67.3 119 10600 1.102 11681.2 65.5 120 1600 1.0285 1645.6 71.4 121 9700 1.102 10689.4 66.5 122 3200 1.0222 3271.04 72.5 123 1000 1.0881 1088.1 68.4 124 5100 1.0373 5290.23 68.2 125 126 4900 1.0799 5291.51 63.4 127 1600 1.0603 1696.48 66.7 128 1600 1.1628 1860.48 61.7 129 3700 1.0604 3923.48 67.4 130 6600 1.0502 6931.32 71.1 131 6900 1.0722 7398.18 71.1 132 6900 1.0661 7356.09 71.2 133 6800 1.0789 7336.52 71.4 134 6100 1.0704 6529.44 71.5 135 7000 1.0816 7571.2 69.6 136 6900 1.0419 7189.11 73.4 137 7300 1.037 7570.1 73.4 138 6900 1.0293 7102.17 72.9 139 8800 1.0313 9075.44 72.9 140 9900 1.0287 10184.13 72.9 −2.6 141 9900 1.0244 10141.56 73 −1.86 142 9600 1.0327 9913.92 72.7 143 8000 1.0281 8224.8 74.6 144 8600 1.0266 8828.76 74.4 145 8200 1.0362 8496.84 74.4 146 7900 1.0366 8189.14 74.4 147 1700 1.1102 1887.34 63.9 148 2000 1.1221 2244.2 64 149 2600 1.1132 2894.32 64.2 150 3000 1.1339 3401.7 62.8 151 3500 1.0861 3801.35 65.4 152 4300 1.0872 4674.96 64.3 153 5600 1.0834 6067.04 65.2 154 5800 1.0893 6317.94 65.5 155 5800 1.0991 6374.78 63.6 156 5000 1.0901 5450.5 63.3 157 9000 1.1791 10611.9 64.3 158 9200 1.1796 10852.32 63.8 159 6200 1.1302 7007.24 71.2 160 6200 1.1229 6961.98 71.1 161 10200 1.1065 11286.3 64 162 10300 1.1121 11454.63 65.3 163 10400 1.1118 11562.72 64.3 164 9500 1.124 10678 67 165 3800 1.1339 4308.82 63.8 166 6000 1.1159 6695.4 60.3 167 5600 1.0165 5692.4 77.6 168 6700 1.0823 7251.41 75.2 169 8800 1.0029 8825.52 80.4 170 8500 1.0377 8820.45 79.5

TABLE 3 Sample No. Q (3 GHz) f Qf (3 GHz) ε′ (3 GHz) 23 3669 3.5075 12869.018 54.69 30 4104 3.301 13547.304 65.06 36 4080 3.283 13394.64 65.81 49 3981 3.3071 13165.565 64.3 50 3952 3.2981 13034.091 55 3619 3.1984 11575.01 68.8 56 3988 3.315 13220.22 63.97 64 3808 3.3186 12637.229 63.85 65 3746 3.2934 12337.076 64.86 66 4175 3.4485 14397.488 59.07 67 3986 3.4196 13630.526 60.08 71 3807 3.3019 12570.333 64.52 72 4161 3.4473 14344.215 59.19 73 3726 3.2956 12279.406 64.89 75 4055 3.273 13272.015 65.84 76 3784 3.2418 12266.971 67.04 77 3548 3.1944 11333.731 69.1 78 3106 3.1836 9888.2616 69.64 79 4152 3.2889 13655.513 65.19 81 3890 3.2922 12806.658 65.06 82 3915 3.243 12696.345 67.01 83 3725 3.2149 11975.503 68.29 84 3319 3.1924 10595.576 69.25 85 4121 3.2855 13539.546 65.33 87 3941 3.2575 12837.808 66.46 88 3864 3.2943 12729.175 65.08 89 3594 3.2154 11556.148 68.36 90 3279 3.158 10355.082 70.9 97 3973 3.2739 13007.205 65.89 99 3955 3.2538 12868.779 66.7 100 3635 3.239 11773.765 67.35 101 3520 3.1777 11185.504 70.03 102 2975 3.1723 9437.5925 70.27 140 3776 3.1235 11794.336 72.7 141 3793 3.1231 11845.918 72.66

As described herein, in some radio-frequency (RF) applications such as low-frequency (700 MHz-1 GHz) microwave applications, materials with dielectric constant values greater than 60 and having Qf (product of Q and frequency f) values greater than 10,000 can be desirable. Among the non-limiting examples listed in Tables 1-3, a number of configurations can include such a combination of relatively high dielectric constant (e.g., greater than 60) and relatively high Qf (e.g., greater than 10,000) at or near such a low-frequency range of 700 MHz-1 GHz. Table 4 lists such configurations selected from the list of Tables 1-3.

TABLE 4 Sample Al Ba Sr La CeO₂ TiO₂ Qf No. % % % % w % w % (1 GHz) ε′ τ_(F) 9 75.1 24.8 0 0 0 0 10499 23 75.1 24.8 0 0 0.25 0 11538 −41.61 30 74.2 48.06 0 2.8 0.25 0 12982 63.1 −62.53 32 24.98 24.91 0 8.89 0.75 0 10008 36 74.75 25.34 0 2.84 0 0 11923 66 −61.19 37 49.68 24.91 0 5.82 0 0 10028 47 50.02 24.84 0 5 0 0 10506 48 50.02 24.84 0 10 0 0 10183 49 70.07 25 0 5 0 0 11880 −55.32 50 70.07 25 0 10 0 0 11536 −48.21 55 50.02 24.84 0 2.5 0 0 10717 −46.15 56 70.07 25 0 2.5 0 0 12139 −57.93 64 69.4 45.02 0 5 0 0 11192 −54.1 65 69.4 45.02 0 10 0 0 10929 −46.83 66 89.23 82.2 0 5 0 0 12259 −62.16 67 89.23 82.2 0 10 0 0 11647 −55.87 71 69.4 45.02 0 2.5 0 0 11296 −58.02 72 89.23 82.2 0 2.5 0 0 12693 −65.23 73 74.2 48 0 10 0 0 10657 65.5 −50.34 75 74.2 0 48 10 0 0 10222 66.3 −51.46 76 74.2 48 0 20 0 0 10354 67.8 −32.96 79 74.75 25.35 0 10 0 0 11663 66 −52.13 82 74.75 25.35 0 20 0 0 10682 67.5 −36.93 85 70.06 25 0 10 0 0 11569 65.8 −48.71 87 70.06 0 25 10 0 0 10201 67 −51.36 88 70.06 25 0 20 0 0 10957 65.5 −32.12 91 89.25 82.3 0 10 0 0 11870 61.2 94 89.25 82.3 0 20 0 0 10160 61.9 97 69.35 45 0 10 0 0 10912 66.9 −47.17 99 69.35 0 45 10 0 0 10295 67.8 −49.31 100 69.35 45 0 20 0 0 10205 68.1 −29.03 105 50 12.5 0 5 0 0 10976 68.7 107 50 25 0 5 0 0 10491 69.2 119 66.67 25 0 5 0 0 11681 65.5 121 66.67 50 0 5 0 0 10689 66.5 140 25 25 0 0 0.067 8.333 10184 72.9 −2.6 141 25 25 0 0 0.033 8.333 10142 73 −1.86 157 70.06 25 .3GeO2 0 .067MnO2 0 10612 64.3 158 70.06 25 .3GeO2 0 0.067 0 10852 63.8 161 70.06 25 0 50Nd2O3 0.067 0 11286 64 162 70.06 25 0 50Nd2O3 .067MnO2 0 11455 65.3 163 70.06 25 .3GeO2 50Nd2O3 0.067 0 11563 64.3 164 70.06 25 .3GeO2 50Nd2O3 .067MnO2 0 10678 67

In Table 4, some of the listed samples do not have measured dielectric constant (∈′) values. However, and as described herein in reference to Formula 1, tungsten bronze based materials, including the samples of Table 4, will tend to have dielectric constant values that are greater than 50.

Also in Table 4, some of the measured values of temperature coefficient of resonant frequency (τ_(f)) are not listed. Among the samples whose τ_(f) values are listed, all of them are negative, mainly due to the Sm being the primary lanthanide. As described herein, such negative values of τ_(f) can be compensated by introduction of other lanthanides (e.g., Nd, Pr, Ce and La) having positive τ_(f) values.

For example, in Table 4, samples 56, 49, 50 and 88 all have the same 70% aluminum percent value and 25% barium percent value, but have increasing lanthanum content (La %) of 2.5%, 5%, 10% and 20%, respectively. For the same samples in the same order, one can see that the τ_(f) values (−57.93, −55.32, −48.21 and −32.12) become less negative as La % value increases.

In some embodiments, materials having one or more features as described herein can be implemented as microwave dielectric materials. As described herein, such microwave dielectric materials can be configured to have dielectric constant values greater than 60. When combined with improved Q performance and temperature compensation capability, such microwave dielectric materials can be desirable for RF applications such as LTE applications in which filters can benefit from reduced sizes.

As described herein, substituting aluminum (Al) for at least some of the titanium (Ti) in the octahedral sites of a tungsten bronze material can yield some or all the foregoing desirable properties. Such substitutions can be effectuated in cost-effective manner.

As also described herein, lanthanides such as Sm and/or Nd can be utilized to achieve temperature compensated ceramic bodies. Table 5 lists additional examples of compositions that show, among others, how temperature coefficient of resonant frequency (τ_(f)) can be adjusted by different combinations of Sm and Nd, and/or different substitutions of Ti with Al.

TABLE 5 Sample Density (g/cm³) Dielectric Constant τ_(F) Qf (at 3 GHz) Ba₄Sm_(9.6)Ti_(17.2)Al_(.8)O₅₄ 5.62 66.33 −50.38 11641 Ba₄Nd_(9.46667)Ti_(17.6)Al_(.4)O₅₄ 5.69 79.5 48.17 16073 Ba₄Nd_(9.6)Ti_(17.2)Al_(.8)O₅₄ 5.67 75.12 32.07 15298 Ba₄Nd_(9.7333)Ti_(16.8)Al_(1.2)O₅₄ 5.70 70.07 13.76 14635 Ba₄Nd_(9.8666)Ti_(16.4)Al_(1.6)O₅₄ 5.35 60.22 8.5 16028 Ba₄Nd_(9.0667)Y_(.4)Ti_(17.6)Al_(.4)O₅₄ 5.63 78.42 26.36 13936 Ba₄Nd_(8.8)Y_(.8)Ti_(17.2)Al_(.8)O₅₄ 5.57 72.3 5.85 14673 Ba₄Sm_(7.5733)Nd_(1.8933)Ti_(17.6)Al_(.4)O₅₄ 5.77 80.27 20.23 15653 Ba₄Sm_(5.76)Nd_(3.84)Y_(.8)Ti_(17.2)Al_(.8)O₅₄ 5.81 74.65 −7.26 16534

At least some of the compositions listed in Table 5 are more specific examples of the samarium (Sm) based compositions described herein in reference to Formula 9 (Ba_(4+x′)Sm_((2/3)[14+0.5y−x′])Ti_(18−y)Al_(y)O₅₄). In the example context of some of Sm being replaced with neodymium (Nd), such a formula can be expressed as

Ba₄(Nd_(1-x)Sm_(X))_(28/3+y/3)Ti_(18−y)Al_(y)O₅₄.  (10)

In Formula 10, x can be referred to as Sm content, and y can be referred to as Al content.

As described in reference to Table 5, temperature coefficient of resonant frequency (τ_(f)) can be tuned by different combinations of Sm and Nd, and/or different substitutions of Ti with Al. Table 6 lists various examples of combinations of the Sm content (x) and the A1 content (y) in reference to Formula 10.

TABLE 6 Sample Qf (at 1 GHz) Qf (at 3 GHz) ε′ x = 0.2, y = 1.6 9796 15907 65.61 x = 0.4, y = 1.2 10210 14448 70.02 x = 0.6, y = 0.8 9436 13107 73.07 x = 0.8, y = 0.4 7688 12021 76.46 x = 0.6, y = 0.4 8824 13247 77.81 x = 0.4, y = 0.8 10302 15395 73.96 x = 0.2, y = 1.2 10151 15638 71.22 x = 0.4, y = 0.4 9068 15593 70.38 x = 0.2, y = 0.8 9154 14851 75.38 x = 0.355, y = 0.68 10500 15321 75.2

For the samples listed in Table 6, their values of τ_(f) are generally in a range of −50 to 0 or 0 to 50. Accordingly, such samples can be utilized to estimate a plane in which τ_(f) is zero or close to zero, if such tuning is desired. For the example described in reference to Formula 10 and Table 6, such a τ_(f)=0 plane can be along an approximate line between points (y≈0, x≈0.77) and (y≈1.8, x≈2) when y (Al content) is on the horizontal axis and x (Sm content) is on the vertical axis. In such a system, one can see that the example configuration of (x=0.355, y=0.68) (last example in Table 6) yields relatively high values of dielectric constant (75.2) and Qf (10500 at 1 GHz), while having τ_(f) that is tuned to a value close to zero. It will be understood that other systems having one or more features as described herein can also be tuned in a similar manner.

In some embodiments, Q value of a system can be adjusted (e.g., enhanced) by adjusting the Sm content (in the example context of the system of Formula 10), adding elements/compounds, and/or substituting elements/compounds. In the context of the example system of Formula 10, a more specific example can be represented by Ba₄Nd_(6.16)Sm_(3.4)Ti_(17.32)Al_(0.68)O₅₄. Examples of adjustments to such a system, and the resulting values of Qf, are listed in Table 7. If a Qf value greater than 10000 is desired, one can see that, for example, substituting Ge_(0.1) for Ti_(0.1) yields a relatively high Qf value of approximately 12300 (at 1 GHz).

TABLE 7 Ba₄Nd_(6.16)Sm_(3.4)Ti_(17.32)Al_(0.68)O₅₄ x = 0.6 Qf = 8467 (1 GHz) x = 0.75 Qf = 8993 (1 GHz) 1% Na₂O added Qf = 9943 (1 GHz) 1% K₂O added Qf = 7597 (1 GHz) +2% Ba₂Ti₉O₂₀ Qf = 9982 (1 GHz) Sn_(.05) for Ti_(.05) Qf = 10040 (1 GHz) (Ba_(3.6)Sr_(0.4)) Qf = 8958 (1 GHz) Mg_(.34)Ti_(.34) for Al_(.68) Qf = 8101 (1 GHz) Zn_(.34)Ti_(.34) for Al_(.68) Qf = 6396 (1 GHz) Ge_(.1) for Ti_(.1) Qf = 12300 (1 GHz) Fe_(.68) for Al_(.68) Qf = 4610 Mn_(.68) for Al_(.68) Qf = 8045 Mg_(.34)Ge_(.34) for Al_(.68) Qf = 8509 Zn_(.34)Ge_(.34) for Al_(.68) Qf = 10044

FIGS. 1 and 2 show examples of microwave devices that can be formed from materials having one or more features as described herein. FIG. 1 shows that in some embodiments, a ceramic puck 100 can include a material as described herein so as to yield desirable properties such as a high dielectric constant (e.g., greater than 60) and a high Qf value (e.g., greater than 10,000) at relatively low frequencies (e.g., 700 MHz-1 GHz). Such a puck 100 can be implemented in a cylindrical shape having a diameter D_(r) and a height L_(r). Such a puck 100 can be utilized as a microwave resonator.

FIG. 2 shows that in some embodiments, a ceramic puck 100 having one or more features as described herein can include a center aperture dimensioned to allow, for example, tuning of the ceramic puck when utilized as a microwave resonator. The aperture is shown to have a diameter of d_(r). The overall diameter D_(r) and the height L_(r) may or may not be the same as the solid ceramic puck counterpart.

FIG. 3 shows a tunable microwave resonator configuration 110. A ceramic puck 100 similar to the example of FIG. 2 is shown to be supported by a support structure. A ceramic tuning element can be dimensioned to fit within the aperture of the ceramic puck 100; and tuning can be achieved by the extent of insertion of the tuning element into the aperture.

FIG. 4 shows an example of a cavity filter 120 having a plurality of cavities 122 arranged between RF ports 124, 126. Each cavity 122 can be dimensioned to receive a resonator puck (e.g., 100 in FIGS. 1 and 2). Such a resonator puck may or may not be tunable. The resonators in their respective cavities can pass successively filtered RF signal through slots formed between neighboring cavities.

FIG. 5 shows an example of an RF system that can utilize one or more of the filter device 120 of FIG. 4. For example, the filter device of FIG. 4 can be implemented as a dielectric narrowband filter 120 between an antenna and a diplexer. The diplexer can be configured to provide a filtered signal to a low-noise amplifier (LNA) to be further processed by an Rx portion of a baseband subsystem. The diplexer can also be configured to route an amplified RF signal from a power amplifier (PA) to the antenna for transmission.

FIGS. June 2010 show examples of how dielectric materials and/or devices having one or more features as described herein can be fabricated. FIG. 6 shows a process 20 that can be implemented to fabricate a ceramic material having one or more of the foregoing properties. In block 21, powder having one or more features as described herein can be prepared. In block 22, a shaped object can be formed from the prepared powder. In block 23, the formed object can be sintered. In block 24, the sintered object can be finished to yield a finished ceramic object having one or more desirable properties.

In implementations where the finished ceramic object is part of a device, the device can be assembled in block 25. In implementations where the device or the finished ceramic object is part of a product, the product can be assembled in block 26.

FIG. 6 further shows that some or all of the steps of the example process 20 can be based on a design, specification, etc. Similarly, some or all of the steps can include or be subjected to testing, quality control, etc.

In some implementations, powder prepared in the powder preparation step (block 21) of FIG. 6 can be formed into different shapes by different forming techniques. By way of an example, FIG. 7 shows a process 50 that can be implemented to press-form a shaped object from a powder material prepared as described herein. In block 52, a shaped die can be filled with a desired amount of the powder. In FIG. 8, configuration 60 shows the shaped die as 61 that defines a volume 62 dimensioned to receive the powder 63 and allow such power to be pressed. In block 53, the powder in the die can be compressed to form a shaped object. Configuration 64 shows the powder in an intermediate compacted form 67 as a piston 65 is pressed (arrow 66) into the volume 62 defined by the die 61. In block 54, pressure can be removed from the die. In block 55, the piston (65) can be removed from the die (61) so as to open the volume (62). Configuration 68 shows the opened volume (62) of the die (61) thereby allowing the formed object 69 to be removed from the die. In block 56, the formed object (69) can be removed from the die (61). In block 57, the formed object can be stored for further processing.

In some implementations, formed objects fabricated as described herein can be sintered to yield desirable physical properties as ceramic devices. FIG. 9 shows a process 70 that can be implemented to sinter such formed objects. In block 71, formed objects can be provided. In block 72, the formed objects can be introduced into a kiln. In FIG. 10, a plurality of formed objects 69 are shown to be loaded into a sintering tray 80. The example tray 80 is shown to define a recess 81 dimensioned to hold the formed objects 69 on a surface 82 so that the upper edge of the tray is higher than the upper portions of the formed objects 69. Such a configuration allows the loaded trays to be stacked during the sintering process. The example tray 80 is further shown to define cutouts 83 at the side walls to allow improved circulation of hot gas at within the recess 81, even when the trays are stacked together. FIG. 10 further shows a stack 84 of a plurality of loaded trays 80. A top cover 85 can be provided so that the objects loaded in the top tray generally experience similar sintering condition as those in lower trays.

In block 73, heat can be applied to the formed objects so as to yield sintered objects. Such application of heat can be achieved by use of a kiln. In block 74, the sintered objects can be removed from the kiln. In FIG. 10, the stack 84 having a plurality of loaded trays is depicted as being introduced into a kiln 87 (stage 86 a). Such a stack can be moved through the kiln (stages 86 b, 86 c) based on a desired time and temperature profile. In stage 86 d, the stack 84 is depicted as being removed from the kiln so as to be cooled.

In block 75, the sintered objects can be cooled. Such cooling can be based on a desired time and temperature profile. In block 76, the cooled objects can undergo one or more finishing operations. In block 77, one or more tests can be performed.

Heat treatment of various forms of powder and various forms of shaped objects are described herein as calcining, firing, annealing, and/or sintering. It will be understood that such terms may be used interchangeably in some appropriate situations, in context-specific manners, or some combination thereof.

Unless the context clearly requires otherwise, throughout the description and the claims, the words “comprise,” “comprising,” and the like are to be construed in an inclusive sense, as opposed to an exclusive or exhaustive sense; that is to say, in the sense of “including, but not limited to.” The word “coupled”, as generally used herein, refers to two or more elements that may be either directly connected, or connected by way of one or more intermediate elements. Additionally, the words “herein,” “above,” “below,” and words of similar import, when used in this application, shall refer to this application as a whole and not to any particular portions of this application. Where the context permits, words in the above Detailed Description using the singular or plural number may also include the plural or singular number respectively. The word “or” in reference to a list of two or more items, that word covers all of the following interpretations of the word: any of the items in the list, all of the items in the list, and any combination of the items in the list.

The above detailed description of embodiments of the invention is not intended to be exhaustive or to limit the invention to the precise form disclosed above. While specific embodiments of, and examples for, the invention are described above for illustrative purposes, various equivalent modifications are possible within the scope of the invention, as those skilled in the relevant art will recognize. For example, while processes or blocks are presented in a given order, alternative embodiments may perform routines having steps, or employ systems having blocks, in a different order, and some processes or blocks may be deleted, moved, added, subdivided, combined, and/or modified. Each of these processes or blocks may be implemented in a variety of different ways. Also, while processes or blocks are at times shown as being performed in series, these processes or blocks may instead be performed in parallel, or may be performed at different times.

The teachings of the invention provided herein can be applied to other systems, not necessarily the system described above. The elements and acts of the various embodiments described above can be combined to provide further embodiments.

While some embodiments of the inventions have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope of the disclosure. Indeed, the novel methods and systems described herein may be embodied in a variety of other forms; furthermore, various omissions, substitutions and changes in the form of the methods and systems described herein may be made without departing from the spirit of the disclosure. The accompanying claims and their equivalents are intended to cover such forms or modifications as would fall within the scope and spirit of the disclosure. 

What is claimed is:
 1. A composition comprising a material with a formula Ba_(4+x)Sm_((2/3)(14−x+0.5y))Ti_(18−y)Al_(y)O₅₄, the quantity y being in a range 0<y<2, the quantity x being in a range 0<x<2−y. 